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Approximate tolerance limits and confidence limits on reliability for the Gamma distribution

JOURNAL ARTICLE published January 1985 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(85)90537-2 Actions

Bayesian confidence limits for the reliability of mixed exponential and distribution-free cascade subsystems

JOURNAL ARTICLE published April 1972 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(72)90592-6 Actions

Approximate lower confidence limits for the Weibull reliability function

JOURNAL ARTICLE published January 1978 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(78)90500-0 Actions

Bayesian confidence limits for the reliability of mixed cascade and parallel independent exponential subsystems

JOURNAL ARTICLE published February 1975 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(75)90351-0 Actions

Robustness and precision of parametric and distribution-free tolerance limits for two lifetime distributions

JOURNAL ARTICLE published January 1990 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(90)90214-8 Actions

Prediction limits for an exponential distribution: a Bayes predictive distribution approach

JOURNAL ARTICLE published January 1991 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(91)90414-3 Actions

Confidence limits

JOURNAL ARTICLE published December 1971 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(71)90008-4 Actions

Reliability estimates for the truncated 2-parameter exponential distribution

JOURNAL ARTICLE published January 1980 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(80)90255-3 Actions

Confidence limits on the failure rate and a rapid projection nomogram for the lognormal distribution

JOURNAL ARTICLE published January 1984 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(84)90917-x Actions

Confidence limits on the failure rate and a rapid projection nomogram for the lognormal distribution

JOURNAL ARTICLE published January 1985 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(85)90047-2 Actions

Total confidence limits on observed reliability

JOURNAL ARTICLE published October 1971 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(71)90121-1 Actions

Prediction intervals for the two-parameter exponential distribution using incomplete data

JOURNAL ARTICLE published January 1985 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(85)90511-6 Actions

Reliability estimation and tolerance limits for Laplace distribution based on censored samples

JOURNAL ARTICLE published March 1996 in Microelectronics Reliability

Authors: N. Balakrishnan | M.P. Chandramouleeswaran

https://doi.org/10.1016/0026-2714(95)00073-9 Actions

Confidence limits on the failure rate and a rapid projection nomogram for the lognormal distribution

JOURNAL ARTICLE published January 1984 in Microelectronics Reliability

Authors: A.S. Jordan

https://doi.org/10.1016/0026-2714(84)90642-5 Actions

Confidence limits for steady state availability of a two unit standby system

JOURNAL ARTICLE published July 1994 in Microelectronics Reliability

Authors: P. Chandrasekhar | R. Natarajan

https://doi.org/10.1016/0026-2714(94)90510-x Actions

Reliability bounds and tolerance limits of two inverse Gaussian models

JOURNAL ARTICLE published February 1994 in Microelectronics Reliability

Authors: Loon Ching Tang | Dong Shang Chang

https://doi.org/10.1016/0026-2714(94)90106-6 Actions

Hardware and software reliability and confidence limits for computer-controlled systems

JOURNAL ARTICLE published January 1980 in Microelectronics Reliability

Authors: Robert D Haynes | William E Thompson

https://doi.org/10.1016/0026-2714(80)90528-4 Actions

Confidence limits for steady-state availability of systems with a mixture of exponential and gamma operating time and lognormal repair time

JOURNAL ARTICLE published September 1996 in Microelectronics Reliability

Authors: P. Chandrasekhar | R. Natarajan

https://doi.org/10.1016/0026-2714(95)00165-4 Actions

Bayesian confidence limits for the availability of systems

JOURNAL ARTICLE published January 1976 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(76)90040-8 Actions

Comparison of Monte Carlo techniques for obtaining system-reliability confidence limits

JOURNAL ARTICLE published January 1981 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(81)90420-0 Actions
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